ONE - Authors

907

One Index

Alam, Muhammad ^PhD 0000-0001-8775-6043

Electrical and Electronic Engineering - Purdue University, West Lafayette

624 docs (1990 - 2024)
Double-Gate Transistors , Degradation (telecommunications) , CMOS Scaling , Negative-bias temperature instability , Metal Gate Transistors

891

One Index

Knobloch, Theresia ^PhD 0000-0001-5156-9510

Electrical and Electronic Engineering - Vienna University of Technology (TUWIEN)

74 docs (2016 - 2024)
Two-Dimensional Materials , Double-Gate Transistors , Hysteresis , Transparent Conductors , CMOS Scaling

889

One Index

Hirose, Sakyo ^PhD 0000-0003-4090-7806

Biomedical Engineering - Tokyo Institute of Technology (TIT)

258 docs (1973 - 2024)
Dynamic Walking , Control of Locomotion , Legged Robots , Passive-Dynamic Walkers , Front cover

886

One Index

Feil, Maximilian Wolfgang ^PhD 0000-0002-5383-5402

Electrical and Electronic Engineering - Infineon Technologies (Germany)

27 docs (2019 - 2024)
Metal Gate Transistors , CMOS Scaling , Double-Gate Transistors , Tunnel Field-Effect Transistors , Perovskite Solar Cells

877

One Index

Islam, Ahmad ^PhD 0000-0002-4233-1233

Electrical and Electronic Engineering - United States Air Force Research Laboratory

132 docs (2006 - 2024)
NBTI Degradation , Negative-bias temperature instability , Metal Gate Transistors , Nanotubes , Carbon Nanotubes

876

One Index

Bansal, Aditya ^PhD 0000-0002-2952-2385

Electrical and Electronic Engineering - Ochsner Medical Center

147 docs (2003 - 2024)
Left Ventricular Assist Device , Ventricular Assist Device , Cardiac Support Device , CMOS Scaling , Double-Gate Transistors

875

One Index

Kim, Chris ^PhD 0000-0002-4194-1347

Electrical and Electronic Engineering - University of Minnesota (UNM), Twin Cities

218 docs (2002 - 2024)
CMOS Scaling , Ring oscillator , Dram , NBTI Degradation , Leakage (economics)

873

One Index

Illarionov, Yury ^PhD 0000-0003-4323-1389

Electrical and Electronic Engineering - Vienna University of Technology (TUWIEN)

85 docs (2010 - 2024)
Double-Gate Transistors , Two-Dimensional Materials , Hysteresis , Tunnel Field-Effect Transistors , Transparent Conductors

873

One Index

Bonaldo, Stefano ^PhD 0000-0003-0712-5036

Electrical and Electronic Engineering - University of Padua

56 docs (2013 - 2024)
Metal Gate Transistors , Tunnel Field-Effect Transistors , Double-Gate Transistors , CMOS Scaling , Biosensors

871

One Index

Vincent, Emmanuel ^PhD 0000-0002-0183-7289

Signal Processing - French Institute for Research in Computer Science and Automation

513 docs (1978 - 2024)
Source Separation , Audio-Visual Speech Recognition , Environmental Sound Recognition , Audio Event Detection , Automatic Speech Recognition

868

One Index

Choi, Changhwan ^PhD 0000-0002-8386-3885

Electrical and Electronic Engineering - Hanyang University (HYU), Seoul

167 docs (2002 - 2024)
Neuromorphic engineering , Resistive Switching , Metal Gate Transistors , Metal gate , Synaptic Plasticity

863

One Index

Radu, Iuliana ^PhD 0000-0002-7230-7218

Electrical and Electronic Engineering - Imec

462 docs (1990 - 2024)
Two-Dimensional Materials , CMOS Scaling , Monolayer MoS2 , Double-Gate Transistors , Contact resistance

858

One Index

Hamdioui, Said ^PhD 0000-0002-8961-0387

Electrical and Electronic Engineering - Delft University of Technology (TU Delft)

507 docs (1998 - 2024)
Memory Applications , Delay Fault Testing , Brain-inspired Computing , Memristor , Non-Volatile Memory

858

One Index

Firouzi, Farshad ^PhD 0000-0002-8359-4304

Electrical and Electronic Engineering - Duke University, Durham

87 docs (2008 - 2024)
CMOS Scaling , NBTI Degradation , Negative-bias temperature instability , Internet of Things , Process Variation

855

One Index

Stesmans, Andre ^PhD 0000-0001-8534-4475

Electrical and Electronic Engineering - KU Leuven

608 docs (1975 - 2021)
Dangling bond , High-k Dielectrics , Passivation , Electrical Properties , Interface Engineering

855

One Index

Reed, Robert ^PhD 0000-0001-9303-9980

Electrical and Electronic Engineering - Vanderbilt University (VU), Nashville

663 docs (1928 - 2024)
Single Event Upsets , Single event upset , Upset , Metal Gate Transistors , Heterojunction bipolar transistor

855

One Index

Amrouch, Hussam ^PhD 0000-0002-5649-3102

Electrical and Electronic Engineering - University of Stuttgart

293 docs (2011 - 2024)
Hyperdimensional Computing , CMOS Scaling , Brain-inspired Computing , Neuromorphic Computing , Memory Applications

854

One Index

Waltl, Michael ^PhD 0000-0001-6042-759X

Electrical and Electronic Engineering - Vienna University of Technology (TUWIEN)

158 docs (2012 - 2024)
CMOS Scaling , NBTI Degradation , Double-Gate Transistors , Metal Gate Transistors , Negative-bias temperature instability

853

One Index

Wang, Yu ^PhD 0000-0001-6108-5157

Electrical and Electronic Engineering - Tsinghua University (THU), Haidian

892 docs (1980 - 2024)
Neuromorphic Computing , Brain-inspired Computing , Speedup , GPU Computing , Memory Applications

850

One Index

Tsetseris, Leonidas ^PhD 0000-0002-0330-0813

Electrical and Electronic Engineering - National Technical University of Athens (NTUA)

188 docs (1996 - 2024)
Organic semiconductor , Two-Dimensional Materials , Atomic units , Graphene , Microelectronics

849

One Index

Alam, Md Ashraful ^PhD 0000-0001-7596-5868

Electrical and Electronic Engineering - North South University

343 docs (1964 - 2024)
Malondialdehyde , CMOS Scaling , Degradation (telecommunications) , NBTI Degradation , Negative-bias temperature instability

849

One Index

Hallam, Brett ^PhD 0000-0002-4811-5240

Electrical and Electronic Engineering - University of New South Wales (UNSW), Kensington

207 docs (2007 - 2024)
Passivation , Degradation (telecommunications) , Solar Cells , Carrier lifetime , Open-circuit voltage

846

One Index

Paccagnella, Alessandro ^PhD 0000-0002-6850-4286

Electrical and Electronic Engineering - University of Padua

624 docs (1984 - 2024)
Metal Gate Transistors , Degradation (telecommunications) , Leakage (economics) , Tunnel Field-Effect Transistors , CMOS Scaling

846

One Index

Grasser, Tibor ^PhD 0000-0001-6536-2238

Electrical and Electronic Engineering - Vienna University of Technology (TUWIEN)

722 docs (1899 - 2024)
CMOS Scaling , NBTI Degradation , Degradation (telecommunications) , Negative-bias temperature instability , Double-Gate Transistors

845

One Index

M Fleetwood, Daniel ^PhD 0000-0003-4257-7142

Electrical and Electronic Engineering - Vanderbilt University (VU), Nashville

787 docs (1982 - 2024)
Metal Gate Transistors , Double-Gate Transistors , Tunnel Field-Effect Transistors , CMOS Scaling , Degradation (telecommunications)

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authors

907 One Index	Alam, Muhammad ^PhD 0000-0001-8775-6043 Electrical and Electronic Engineering - Purdue University, West Lafayette	624 docs (1990 - 2024) Double-Gate Transistors , Degradation (telecommunications) , CMOS Scaling , Negative-bias temperature instability , Metal Gate Transistors
891 One Index	Knobloch, Theresia ^PhD 0000-0001-5156-9510 Electrical and Electronic Engineering - Vienna University of Technology (TUWIEN)	74 docs (2016 - 2024) Two-Dimensional Materials , Double-Gate Transistors , Hysteresis , Transparent Conductors , CMOS Scaling
889 One Index	Hirose, Sakyo ^PhD 0000-0003-4090-7806 Biomedical Engineering - Tokyo Institute of Technology (TIT)	258 docs (1973 - 2024) Dynamic Walking , Control of Locomotion , Legged Robots , Passive-Dynamic Walkers , Front cover
886 One Index	Feil, Maximilian Wolfgang ^PhD 0000-0002-5383-5402 Electrical and Electronic Engineering - Infineon Technologies (Germany)	27 docs (2019 - 2024) Metal Gate Transistors , CMOS Scaling , Double-Gate Transistors , Tunnel Field-Effect Transistors , Perovskite Solar Cells
877 One Index	Islam, Ahmad ^PhD 0000-0002-4233-1233 Electrical and Electronic Engineering - United States Air Force Research Laboratory	132 docs (2006 - 2024) NBTI Degradation , Negative-bias temperature instability , Metal Gate Transistors , Nanotubes , Carbon Nanotubes
876 One Index	Bansal, Aditya ^PhD 0000-0002-2952-2385 Electrical and Electronic Engineering - Ochsner Medical Center	147 docs (2003 - 2024) Left Ventricular Assist Device , Ventricular Assist Device , Cardiac Support Device , CMOS Scaling , Double-Gate Transistors
875 One Index	Kim, Chris ^PhD 0000-0002-4194-1347 Electrical and Electronic Engineering - University of Minnesota (UNM), Twin Cities	218 docs (2002 - 2024) CMOS Scaling , Ring oscillator , Dram , NBTI Degradation , Leakage (economics)
873 One Index	Illarionov, Yury ^PhD 0000-0003-4323-1389 Electrical and Electronic Engineering - Vienna University of Technology (TUWIEN)	85 docs (2010 - 2024) Double-Gate Transistors , Two-Dimensional Materials , Hysteresis , Tunnel Field-Effect Transistors , Transparent Conductors
873 One Index	Bonaldo, Stefano ^PhD 0000-0003-0712-5036 Electrical and Electronic Engineering - University of Padua	56 docs (2013 - 2024) Metal Gate Transistors , Tunnel Field-Effect Transistors , Double-Gate Transistors , CMOS Scaling , Biosensors
871 One Index	Vincent, Emmanuel ^PhD 0000-0002-0183-7289 Signal Processing - French Institute for Research in Computer Science and Automation	513 docs (1978 - 2024) Source Separation , Audio-Visual Speech Recognition , Environmental Sound Recognition , Audio Event Detection , Automatic Speech Recognition
868 One Index	Choi, Changhwan ^PhD 0000-0002-8386-3885 Electrical and Electronic Engineering - Hanyang University (HYU), Seoul	167 docs (2002 - 2024) Neuromorphic engineering , Resistive Switching , Metal Gate Transistors , Metal gate , Synaptic Plasticity
863 One Index	Radu, Iuliana ^PhD 0000-0002-7230-7218 Electrical and Electronic Engineering - Imec	462 docs (1990 - 2024) Two-Dimensional Materials , CMOS Scaling , Monolayer MoS2 , Double-Gate Transistors , Contact resistance
858 One Index	Hamdioui, Said ^PhD 0000-0002-8961-0387 Electrical and Electronic Engineering - Delft University of Technology (TU Delft)	507 docs (1998 - 2024) Memory Applications , Delay Fault Testing , Brain-inspired Computing , Memristor , Non-Volatile Memory
858 One Index	Firouzi, Farshad ^PhD 0000-0002-8359-4304 Electrical and Electronic Engineering - Duke University, Durham	87 docs (2008 - 2024) CMOS Scaling , NBTI Degradation , Negative-bias temperature instability , Internet of Things , Process Variation
855 One Index	Stesmans, Andre ^PhD 0000-0001-8534-4475 Electrical and Electronic Engineering - KU Leuven	608 docs (1975 - 2021) Dangling bond , High-k Dielectrics , Passivation , Electrical Properties , Interface Engineering
855 One Index	Reed, Robert ^PhD 0000-0001-9303-9980 Electrical and Electronic Engineering - Vanderbilt University (VU), Nashville	663 docs (1928 - 2024) Single Event Upsets , Single event upset , Upset , Metal Gate Transistors , Heterojunction bipolar transistor
855 One Index	Amrouch, Hussam ^PhD 0000-0002-5649-3102 Electrical and Electronic Engineering - University of Stuttgart	293 docs (2011 - 2024) Hyperdimensional Computing , CMOS Scaling , Brain-inspired Computing , Neuromorphic Computing , Memory Applications
854 One Index	Waltl, Michael ^PhD 0000-0001-6042-759X Electrical and Electronic Engineering - Vienna University of Technology (TUWIEN)	158 docs (2012 - 2024) CMOS Scaling , NBTI Degradation , Double-Gate Transistors , Metal Gate Transistors , Negative-bias temperature instability
853 One Index	Wang, Yu ^PhD 0000-0001-6108-5157 Electrical and Electronic Engineering - Tsinghua University (THU), Haidian	892 docs (1980 - 2024) Neuromorphic Computing , Brain-inspired Computing , Speedup , GPU Computing , Memory Applications
850 One Index	Tsetseris, Leonidas ^PhD 0000-0002-0330-0813 Electrical and Electronic Engineering - National Technical University of Athens (NTUA)	188 docs (1996 - 2024) Organic semiconductor , Two-Dimensional Materials , Atomic units , Graphene , Microelectronics
849 One Index	Alam, Md Ashraful ^PhD 0000-0001-7596-5868 Electrical and Electronic Engineering - North South University	343 docs (1964 - 2024) Malondialdehyde , CMOS Scaling , Degradation (telecommunications) , NBTI Degradation , Negative-bias temperature instability
849 One Index	Hallam, Brett ^PhD 0000-0002-4811-5240 Electrical and Electronic Engineering - University of New South Wales (UNSW), Kensington	207 docs (2007 - 2024) Passivation , Degradation (telecommunications) , Solar Cells , Carrier lifetime , Open-circuit voltage
846 One Index	Paccagnella, Alessandro ^PhD 0000-0002-6850-4286 Electrical and Electronic Engineering - University of Padua	624 docs (1984 - 2024) Metal Gate Transistors , Degradation (telecommunications) , Leakage (economics) , Tunnel Field-Effect Transistors , CMOS Scaling
846 One Index	Grasser, Tibor ^PhD 0000-0001-6536-2238 Electrical and Electronic Engineering - Vienna University of Technology (TUWIEN)	722 docs (1899 - 2024) CMOS Scaling , NBTI Degradation , Degradation (telecommunications) , Negative-bias temperature instability , Double-Gate Transistors
845 One Index	M Fleetwood, Daniel ^PhD 0000-0003-4257-7142 Electrical and Electronic Engineering - Vanderbilt University (VU), Nashville	787 docs (1982 - 2024) Metal Gate Transistors , Double-Gate Transistors , Tunnel Field-Effect Transistors , CMOS Scaling , Degradation (telecommunications)